Time-Resolved ODMR Measurements on the 'Yellow Luminescence' in MOCVD-Grown GaN Films |
| Journal |
Materials Science Forum (Volumes 196 - 201) |
| Volume |
Defects in Semiconductors 18 |
| Edited by |
M. Suezawa and H. Katayama-Yoshida |
| Pages |
37-42 |
| DOI |
10.4028/www.scientific.net/MSF.196-201.37 |
| Citation |
F.K. Koschnick et al., 1995, Materials Science Forum, 196-201, 37 |
| Authors |
F.K. Koschnick, Johann Martin Spaeth, E.R. Glaser, K. Doverspike, L.B. Rowland, D. Kurt Gaskill, D.K. Wickenden |
| Keywords |
Galium Nitride (GaN), Luminescence, ODMR, Recombination Process, Time-Resolved ODMR |
| Full Paper |
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