Paper Title:
Defect Induced Electron Transport Trough Semiconductor Barriers
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 196-201)
Edited by
M. Suezawa and H. Katayama-Yoshida
Pages
437-442
DOI
10.4028/www.scientific.net/MSF.196-201.437
Citation
J.C. Bourgoin, L. El Mir, "Defect Induced Electron Transport Trough Semiconductor Barriers", Materials Science Forum, Vols. 196-201, pp. 437-442, 1995
Online since
November 1995
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