Paper Title:
Profiling the Deep Levels inSiGe/Si Microstructure by Small-Pulse Deep Level Transient Spectroscopy
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 196-201)
Edited by
M. Suezawa and H. Katayama-Yoshida
Pages
485-490
DOI
10.4028/www.scientific.net/MSF.196-201.485
Citation
R. Zhang, K. Yang, G. Qing, Y. Shi, S. L. Gu, R. H. Wang, L. Q. Hu, W. Gao, Y. D. Zheng, "Profiling the Deep Levels inSiGe/Si Microstructure by Small-Pulse Deep Level Transient Spectroscopy", Materials Science Forum, Vols. 196-201, pp. 485-490, 1995
Online since
November 1995
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