Paper Title:
Strain Characterization of Hg1-xFexSe-Layers by Electron Spin Resonance
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 196-201)
Edited by
M. Suezawa and H. Katayama-Yoshida
Pages
561-566
DOI
10.4028/www.scientific.net/MSF.196-201.561
Citation
G. Hendorfer, W. Jantsch, W. Helzel, J.H. Li, Z. Wilamowski, T. Widmer, D. Schikora, K. Lischka, "Strain Characterization of Hg1-xFexSe-Layers by Electron Spin Resonance", Materials Science Forum, Vols. 196-201, pp. 561-566, 1995
Online since
November 1995
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Price
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