Paper Title:
Erbium in Silicon: A Defect System for Optoelectronic Intergrated Ciricuits
  Abstract

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Periodical
Materials Science Forum (Volumes 196-201)
Edited by
M. Suezawa and H. Katayama-Yoshida
Pages
585-590
DOI
10.4028/www.scientific.net/MSF.196-201.585
Citation
J. Michel, J. Palm, F.X. Gan, F.Y.G. Ren, B. Zheng, S.T. Dunham, L. C. Kimerling, "Erbium in Silicon: A Defect System for Optoelectronic Intergrated Ciricuits", Materials Science Forum, Vols. 196-201, pp. 585-590, 1995
Online since
November 1995
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Price
$32.00
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