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Defects in Semiconductors 18

Materials Science Forum Volumes 196 - 201

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• p1973 Characterization of Electron Traps in n-InP Induced by Hydrogen Plasma   [ 297 K ]
  Authors: Yoshifumi Sakamoto, Takashi Sugino, Koichiro Matsuda, Junji Shirafuji
• p1979 Gettering of Transition Metals in Multicrystalline Silicon   [ 304 K ]
  Authors: Scott A. McHugo, H. Hieslmair, Eicke R. Weber
• p1985 Substitutional Gettering of Platinum by Diffusion into Ion-Beam Damaged Silicon   [ 317 K ]
  Authors: K. Bonde Nielsen, B. Holm
• p1991 Gettering of Iron Using Electrically Inactive Boron Doped Layer   [ 254 K ]
  Authors: Hiroshi Tomita, Mami Saito, Kikuo Yamabe
• p1997 Ab Initio Calculation for G-Values of ESR Centers in a-Si:H   [ 262 K ]
  Authors: Hideki Katagiri