Paper Title:
Lattice Strain Analysis of VPE-Grown ZnS Epitaxial Layers on (001) GaAs by RBS - Channeling and High Resolution XRD Measurements
  Abstract

  Info
Periodical
Edited by
A.M. Mancini, C. Paorici and M.L. Terranova
Pages
237-242
DOI
10.4028/www.scientific.net/MSF.203.237
Citation
G. Leo, T. Peluso, N. Lovergine, A. M. Mancini, L. Vasanelli, C. Giannini, L. Tapfer, F. Romanato, A.V. Drigo, "Lattice Strain Analysis of VPE-Grown ZnS Epitaxial Layers on (001) GaAs by RBS - Channeling and High Resolution XRD Measurements", Materials Science Forum, Vol. 203, pp. 237-242, 1996
Online since
February 1996
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