Paper Title:
SIMS-ETAAS Characterisation of Background Impurites in CdZnTe Bulk Samples
  Abstract

  Info
Periodical
Edited by
A.M. Mancini, C. Paorici and M.L. Terranova
Pages
273-278
DOI
10.4028/www.scientific.net/MSF.203.273
Citation
C. Gerardi, E. Milella, F. Campanella, S. Bernardi, "SIMS-ETAAS Characterisation of Background Impurites in CdZnTe Bulk Samples", Materials Science Forum, Vol. 203, pp. 273-278, 1996
Online since
February 1996
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Price
$32.00
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