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HomeMaterials Science ForumMaterials Science Forum Vols. 204-206High-Resolution Electron Microscopy Observations...

High-Resolution Electron Microscopy Observations of Grain Boundary Structures in Submicrometer-Grained Al-Mg Alloys

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Grain Growth in Polycrystalline Materials II

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Periodical:

Materials Science Forum (Volumes 204-206)

Pages:

437-442

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.204-206.437

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Online since:

March 1996

Authors:

Z. Horita, David John Smith, M. Furukawa, M. Nemoto, Ruslan Valiev, Terence G. Langdon

Keywords:

Al-3%Mg, Grain Boundary Migration, Grain Boundary Structure, High Resolution Electron Microscopy (HREM), Nonequilibrium Grain Boundary, Submicron Grain Size

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© 1996 Trans Tech Publications Ltd. All Rights Reserved

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