Paper Title:
Atomic Force Microscopy Study of Grain Evolution during Growth of Thin Oxide Films
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 204-206)
Edited by
H. Yoshinaga, T. Watanabe and N. Takahashi
Pages
729-734
DOI
10.4028/www.scientific.net/MSF.204-206.729
Citation
F. Czerwinski, J. A. Szpunar, "Atomic Force Microscopy Study of Grain Evolution during Growth of Thin Oxide Films", Materials Science Forum, Vols. 204-206, pp. 729-734, 1996
Online since
March 1996
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.