Paper Title:
X-Ray Diffraction Measurments of Grain Size as a Function of Orientation in Primary Recrystallized Silicon-Iron
  Abstract

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Periodical
Materials Science Forum (Volumes 204-206)
Edited by
H. Yoshinaga, T. Watanabe and N. Takahashi
Pages
743-748
DOI
10.4028/www.scientific.net/MSF.204-206.743
Citation
S. Fortunati, W. Graupner, "X-Ray Diffraction Measurments of Grain Size as a Function of Orientation in Primary Recrystallized Silicon-Iron", Materials Science Forum, Vols. 204-206, pp. 743-748, 1996
Online since
March 1996
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Price
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