Paper Title:
In Situ Atomic Resolution Electron Microscopy of Metal-Mediated Crystallization of Semiconductors
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 204-206)
Edited by
H. Yoshinaga, T. Watanabe and N. Takahashi
Pages
749-754
DOI
10.4028/www.scientific.net/MSF.204-206.749
Citation
T. J. Konno, R. Sinclair, "In Situ Atomic Resolution Electron Microscopy of Metal-Mediated Crystallization of Semiconductors", Materials Science Forum, Vols. 204-206, pp. 749-754, 1996
Online since
March 1996
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Price
$32.00
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