Analyzing Method of Surface Structures by X-Ray Photoelectron Spectroscopy (XPS) |
| Journal |
Materials Science Forum (Volumes 204 - 206) |
| Volume |
Grain Growth in Polycrystalline Materials II |
| Edited by |
H. Yoshinaga, T. Watanabe and N. Takahashi |
| Pages |
755-0 |
| DOI |
10.4028/www.scientific.net/MSF.204-206.755 |
| Citation |
Ryouji Kosugi et al., 1996, Materials Science Forum, 204-206, 755 |
| Authors |
Ryouji Kosugi, S. Fujita, Y. Takakuwa, J. Tani, Nao Miyamoto, Yasuhiro Yamazaki |
| Keywords |
Computer Simulation, Crystal Structure, GaAs, Lattice Site, Nano Structure, Single-Scattering-Cluster Model, Solid Diffusion, X-Ray Photoelectron Diffraction |
| Full Paper |
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