In-Situ Observations of Grain Boundary Migration |
| Journal |
Materials Science Forum (Volumes 204 - 206) |
| Volume |
Grain Growth in Polycrystalline Materials II |
| Edited by |
H. Yoshinaga, T. Watanabe and N. Takahashi |
| Pages |
99-108 |
| DOI |
10.4028/www.scientific.net/MSF.204-206.99 |
| Citation |
Günter Gottstein et al., 1996, Materials Science Forum, 204-206, 99 |
| Authors |
Günter Gottstein, U. Czubayko, Dmitri A. Molodov, Lasar S. Shvindlerman, Wilfried Wunderlich |
| Keywords |
Bicrystals, Grain Boundary Migration, High Resolution Transmission Electron Microscopy, Impurity Drag, Mobility, Mobility Enhancement, Orientation Dependence, Thin Film, XICTD |
| Full Paper |
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