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Intergranular and Interphase Boundaries in Materials

Materials Science Forum Volumes 207 - 209

• Papers
• Abstracts

• p1 Why Should we Be Interested in the Atomic Structure of Interfaces?   [ 868 K ]
  Authors: R.W. Balluffi, A.P. Sutton
• p13 Orientation Imaging Microscopy: Applications to the Characterization of the Grain-Boundary Network   [ 563 K ]
  Authors: Brent L. Adams
• p23 Quantitative High-Resolution Electron Microscopy of Interfaces   [ 742 K ]
  Authors: F. Ernst, Dieter Hofmann, K. Nadarzinski, C. Schmidt, S. Stemmer, S.K. Streiffer
• p35 Calculating and Understanding the Structure of Interfaces   [ 617 K ]
  Authors: Mike W. Finnis
• p47 Electrical Resistivity and Grain Boundaries in Metals   [ 636 K ]
  Authors: I. Nakamichi
• p59 Lines of Grain Boundary Phase Transitions in Bulk Phase Diagrams   [ 539 K ]
  Authors: Boris Straumal, W. Gust
• p69 Chemical Aspects of Metal-Ceramic Interactions   [ 740 K ]
  Authors: A.A. Kodentsov, M.R. Rijnders, F.J.J. van Loo
• p79 Atomic-Scale Investigation of Grain Boundary Segregation in Astroloy with a Three Dimensional Atom-Probe   [ 773 K ]
  Authors: D. Blavette, L. Letellier, P. Duval, M. Guttmann
• p93 Influence of Hydrogen on the Stacking-Fault Energy of an Austenitic Stainless Steel   [ 198 K ]
  Authors: P.J. Ferreira, Ian M. Robertson, H.K. Birnbaum
• p97 Structure and Composition of a Special Twin Boundary in α-Al₂O₃   [ 225 K ]
  Authors: T. Höche, M. Rühle
• p101 Importance of Non-Central Interatomic Forces in Atomistic Studies of Grain Boundaries   [ 291 K ]
  Authors: V. Vitek, A.G. Marinopoulos
• p105 A Direct Method for Density Matrix Calculation: Application to Si Grain Boundaries in the Tight-Binding Scheme   [ 171 K ]
  Authors: A. Hairie, F. Hairie, B. Lebouvier, E. Paumier
• p109 Interface Diffusion under an Electric Field. Interface Evolution   [ 204 K ]
  Authors: Leonid M. Klinger, L. Levin, David J. Srolovitz
• p113 Experimental and Theoretical Investigation of Dislocations in {10¯12} Twins in Zinc   [ 236 K ]
  Authors: T. Braisaz, David J. Bacon, Gerard Nouet, R.C. Pond, Piere Ruterana, A. Serra
• p117 TEM Characterization of Invariant Line Interfaces and Structural Ledges in a Mo-Si Alloy   [ 526 K ]
  Authors: S.Q. Xiao, U. Dahmen, S.A. Maloy, A.H. Heuer