Paper Title:
TEM Characterization of Invariant Line Interfaces and Structural Ledges in a Mo-Si Alloy
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 207-209)
Edited by
A.C. Ferro, J.P. Conde and M.A. Fortes
Pages
117-120
DOI
10.4028/www.scientific.net/MSF.207-209.117
Citation
S.Q. Xiao, U. Dahmen, S.A. Maloy, A.H. Heuer, "TEM Characterization of Invariant Line Interfaces and Structural Ledges in a Mo-Si Alloy", Materials Science Forum, Vols. 207-209, pp. 117-120, 1996
Online since
February 1996
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Price
$32.00
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