TEM Characterization of Invariant Line Interfaces and Structural Ledges in a Mo-Si Alloy |
| Journal |
Materials Science Forum (Volumes 207 - 209) |
| Volume |
Intergranular and Interphase Boundaries in Materials |
| Edited by |
A.C. Ferro, J.P. Conde and M.A. Fortes |
| Pages |
117-120 |
| DOI |
10.4028/www.scientific.net/MSF.207-209.117 |
| Citation |
S.Q. Xiao et al., 1996, Materials Science Forum, 207-209, 117 |
| Authors |
S.Q. Xiao, U. Dahmen, S.A. Maloy, A.H. Heuer |
| Keywords |
Electron Microscopy, Interface, Intermetallic, Invariant Line, Mo-Si, Partial Dislocations, Precipitation, Structural Ledges |
| Full Paper |
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