Paper Title:
Kelvin Microprobe Investigation of the Surface Potential across Charged Grain Boundaries in Silicon
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 207-209)
Edited by
A.C. Ferro, J.P. Conde and M.A. Fortes
Pages
149-152
DOI
10.4028/www.scientific.net/MSF.207-209.149
Citation
A. Broniatowski, W. Nabhan, B. Equer, G. de Rosny, "Kelvin Microprobe Investigation of the Surface Potential across Charged Grain Boundaries in Silicon", Materials Science Forum, Vols. 207-209, pp. 149-152, 1996
Online since
February 1996
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Price
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