Paper Title:
Quantitative High-Resolution Electron Microscopy of Interfaces
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 207-209)
Edited by
A.C. Ferro, J.P. Conde and M.A. Fortes
Pages
23-34
DOI
10.4028/www.scientific.net/MSF.207-209.23
Citation
F. Ernst, D. Hofmann, K. Nadarzinski, C. Schmidt, S. Stemmer, S.K. Streiffer, "Quantitative High-Resolution Electron Microscopy of Interfaces", Materials Science Forum, Vols. 207-209, pp. 23-34, 1996
Online since
February 1996
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Price
$32.00
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