Quantitative High-Resolution Electron Microscopy of Interfaces |
| Journal |
Materials Science Forum (Volumes 207 - 209) |
| Volume |
Intergranular and Interphase Boundaries in Materials |
| Edited by |
A.C. Ferro, J.P. Conde and M.A. Fortes |
| Pages |
23-34 |
| DOI |
10.4028/www.scientific.net/MSF.207-209.23 |
| Citation |
F. Ernst et al., 1996, Materials Science Forum, 207-209, 23 |
| Authors |
F. Ernst, Dieter Hofmann, K. Nadarzinski, C. Schmidt, S. Stemmer, S.K. Streiffer |
| Keywords |
Atomistic Structure, Domain Boundaries, Quantitative HRTEM, Twin Boundaries |
| Full Paper |
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