Paper Title:
Theoretical Study of Grain Boundaries in Silicon: Features of Atomic and Electronic Structures
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 207-209)
Edited by
A.C. Ferro, J.P. Conde and M.A. Fortes
Pages
265-268
DOI
10.4028/www.scientific.net/MSF.207-209.265
Citation
M. Kohyama, "Theoretical Study of Grain Boundaries in Silicon: Features of Atomic and Electronic Structures", Materials Science Forum, Vols. 207-209, pp. 265-268, 1996
Online since
February 1996
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$32.00
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