Paper Title:

XPS Study of Ni Layers Deposited on 6H-SiC

Periodical Materials Science Forum (Volumes 207 - 209)
Main Theme Intergranular and Interphase Boundaries in Materials
Edited by A.C. Ferro, J.P. Conde and M.A. Fortes
Pages 293-296
DOI 10.4028/www.scientific.net/MSF.207-209.293
Citation Ts. Marinova et al., 1996, Materials Science Forum, 207-209, 293
Authors Ts. Marinova, V. Krastev, Christer Hallin, Rositza Yakimova, Erik Janzén
Keywords Electrical Property, Layer, Nickel Ni, Ohmic Contact, Silicon Carbide (SiC), X-Ray Photoelectron Spectroscopy (XPS)
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