Paper Title:
XPS Study of Ni Layers Deposited on 6H-SiC
| Periodical |
Materials Science Forum (Volumes 207 - 209)
|
| Main Theme |
Intergranular and Interphase Boundaries in Materials
|
| Edited by |
A.C. Ferro, J.P. Conde and M.A. Fortes |
| Pages |
293-296 |
| DOI |
10.4028/www.scientific.net/MSF.207-209.293 |
| Citation |
Ts. Marinova et al., 1996, Materials Science Forum, 207-209, 293 |
| Authors |
Ts. Marinova, V. Krastev, Christer Hallin, Rositza Yakimova, Erik Janzén |
| Keywords |
Electrical Property, Layer, Nickel Ni, Ohmic Contact, Silicon Carbide (SiC), X-Ray Photoelectron Spectroscopy (XPS) |
| Price |
US$ 28,- |