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Intergranular and Interphase Boundaries in Materials

Materials Science Forum Volumes 207 - 209

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• p181 Electron Energy-Loss Spectroscopy at Cu/Al₂O₃ and Ti/Al₂O₃ Interfaces   [ 229 K ]
  Authors: C. Scheu, G. Dehm, H. Müllejans, M. Rühle
• p185 The Interface Structure during Solid State Reactions and Its Influence on Reaction Kinetics and Reaction Mechanism   [ 587 K ]
  Authors: D. Hesse, P. Werner
• p189 Computer Simulation and Particular Properties of ∑=3ⁿ Boundaries and Their Groups   [ 227 K ]
  Authors: A.V. Andreeva, A.A. Firsova
• p193 Carbon Precipitation in a ∑=5 Tilt Boundary in Molybdenum   [ 409 K ]
  Authors: M. Bacia, Jean-Michel Pénisson, M. Biscondi
• p197 Structural Evolution with Thickness of Largely Strained Multilayers: Au/Ni System   [ 323 K ]
  Authors: P. Bayle-Guillemaud, J. Thibault
• p201 Misfit Dislocations Associated with Ultrathin Twins along a Ni₃Al / Ni₃Nb Interface   [ 429 K ]
  Authors: R. Bonnet, M. Loubradou, U. Dahmen, S. Hinderberger
• p205 Structure and Chemistry of Grain Boundaries in Ytrria Doped Aluminas   [ 254 K ]
  Authors: D. Bouchet, F. Dupau, Sylvie Lartigue-Korinek
• p209 The 112 Lateral Twin Boundary in FCC Materials   [ 302 K ]
  Authors: C.B. Carter, D.L. Medlin, J.E. Angelo, Michael J. Mills
• p213 HRTEM and LACBED Analysis of Strain Fields Induced by the Precipitation of Chromium in Alumina during Internal Reduction   [ 256 K ]
  Authors: C. Deininger, A. Peyrot-Chabrol, M. Backhaus-Ricoult, S. Hagège
• p217 Growth, Structure and Interfaces of Cu and Cu/Ti Thin Films on (0001) α-Al₂O₃   [ 392 K ]
  Authors: G. Dehm, C. Scheu, R. Raj, M. Rühle
• p221 A Candidate for Grain Boundary Pipe Diffusion and Intrinsic Electrical Activity in Silicon   [ 234 K ]
  Authors: O.B.M. Hardouin Duparc, M. Torrent
• p225 Atomistic Simulation of Grain Boundaries in Alumina   [ 222 K ]
  Authors: M. Exner, Mike W. Finnis
• p229 Grain Boundary Structure in Ni₃Al   [ 222 K ]
  Authors: Diana Farkas
• p233 Epitaxy of Deposited α-Fe Films on High-Index Cu Substrate Planes   [ 256 K ]
  Authors: T. Fujii, N. Sarlis, Shozo Inoue, Masashi Kato
• p237 Interfaces in SiC/C CVD Multilayers   [ 394 K ]
  Authors: F. Gourbilleau, Gerard Nouet, M. Ducarroir