X-Ray Diffraction Characterization of Thin Superconductive Films |
| Journal |
Materials Science Forum (Volumes 210 - 213) |
| Volume |
Nondestructive Characterization of Materials VII |
| Edited by |
Anthony L. Bartos, Robert E. Green, Jr. and Clayton O. Ruud |
| Pages |
203-210 |
| DOI |
10.4028/www.scientific.net/MSF.210-213.203 |
| Citation |
Kris J. Kozaczek et al., 1996, Materials Science Forum, 210-213, 203 |
| Authors |
Kris J. Kozaczek, G.W. Book, T.R. Watkins, W.B. Carter |
| Keywords |
High Tc Superconductors, Texture, Thin Film, X-Ray Diffraction (XRD) |
| Full Paper |
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