Paper Title:
X-Ray Diffraction Characterization of Thin Superconductive Films
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 210-213)
Edited by
Anthony L. Bartos, Robert E. Green, Jr. and Clayton O. Ruud
Pages
203-210
DOI
10.4028/www.scientific.net/MSF.210-213.203
Citation
K. J. Kozaczek, G.W. Book, T.R. Watkins, W.B. Carter, "X-Ray Diffraction Characterization of Thin Superconductive Films", Materials Science Forum, Vols. 210-213, pp. 203-210, 1996
Online since
May 1996
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Price
$35.00
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