Paper Title:
An X-Ray Sensitive CCD Camera System and Its Application to the X-Ray Diffractometric Investigation on Area Selective Semiconductor Epitaxy
  Abstract

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Periodical
Materials Science Forum (Volumes 210-213)
Edited by
Anthony L. Bartos, Robert E. Green, Jr. and Clayton O. Ruud
Pages
219-226
DOI
10.4028/www.scientific.net/MSF.210-213.219
Citation
F. Fandrich, R. Köhler, "An X-Ray Sensitive CCD Camera System and Its Application to the X-Ray Diffractometric Investigation on Area Selective Semiconductor Epitaxy", Materials Science Forum, Vols. 210-213, pp. 219-226, 1996
Online since
May 1996
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Price
$32.00
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