Paper Title:
Thermal-Wave Imaging: A Non-Destructive Technique to Characterize the Electromigration on Al Alloy
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 210-213)
Edited by
Anthony L. Bartos, Robert E. Green, Jr. and Clayton O. Ruud
Pages
309-316
DOI
10.4028/www.scientific.net/MSF.210-213.309
Citation
A. Brun, M. Marty, H. Roede, C. Gounelle, F. Giroux, "Thermal-Wave Imaging: A Non-Destructive Technique to Characterize the Electromigration on Al Alloy", Materials Science Forum, Vols. 210-213, pp. 309-316, 1996
Online since
May 1996
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Price
$32.00
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