Paper Title:
Nondestructive Morphological Characterization of Latent and Etched Ion Tracks in PETP by SANS
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 210-213)
Edited by
Anthony L. Bartos, Robert E. Green, Jr. and Clayton O. Ruud
Pages
719-726
DOI
10.4028/www.scientific.net/MSF.210-213.719
Citation
F. Haeussler, M. Hempel, W. Birkholz, M. Kröning, H. Baumbach, "Nondestructive Morphological Characterization of Latent and Etched Ion Tracks in PETP by SANS", Materials Science Forum, Vols. 210-213, pp. 719-726, 1996
Online since
May 1996
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