Materials Science Forum

Paper Title	Page
Neutron Diffraction Residual Stress Measurement at NIST Authors: Henry Prask, P.C. Brand	155
Localized Stress Measurement of Aluminum Alloy with Acoustic Microscope Authors: M. Okade, K. Kawashima	163
Acoustoelastic Determination of Stresses in Steel Using Rayleigh Ultrasonic Waves Authors: Teresa Berruti, Muzio M. Gola	171
The Eddy Current Technique for Determining Residual Stresses in Steels Authors: M. Blaszkiewicz, L. Albertin, W. Junker	179
Recent Developments in Non-Destructive Characterization of Aerosols by Synchrotron Radiation Authors: C. Landron	187
Nondestructive Measurement of Grain Size in Steel Plate by X-Ray Diffraction Authors: F. Ichikawa, M. Okuno, Mitsuo Okamoto, F. Tanaka	195
X-Ray Diffraction Characterization of Thin Superconductive Films Authors: Kris J. Kozaczek, G.W. Book, T.R. Watkins, W.B. Carter	203
X-Ray Backscatter Tomography: NDT Potential and Limitations Authors: C.F. Poranski, E.C. Greenawald, Young Sam Ham	211
An X-Ray Sensitive CCD Camera System and Its Application to the X-Ray Diffractometric Investigation on Area Selective Semiconductor Epitaxy Authors: F. Fandrich, R. Köhler	219
Determination of the Elastic Behaviour of Carbon-Reinforced Carbon Materials Using Laser-Ultrasound and Theoretical Modeling Authors: M. Paul, B. Haberer, Andreas Hoffmann, M. Spies, W. Arnold	227

Paper Title

Page

Neutron Diffraction Residual Stress Measurement at NIST

Authors: Henry Prask, P.C. Brand

155

Localized Stress Measurement of Aluminum Alloy with Acoustic Microscope

Authors: M. Okade, K. Kawashima

163

Acoustoelastic Determination of Stresses in Steel Using Rayleigh Ultrasonic Waves

Authors: Teresa Berruti, Muzio M. Gola

171

The Eddy Current Technique for Determining Residual Stresses in Steels

Authors: M. Blaszkiewicz, L. Albertin, W. Junker

179

Recent Developments in Non-Destructive Characterization of Aerosols by Synchrotron Radiation

Authors: C. Landron

187

Nondestructive Measurement of Grain Size in Steel Plate by X-Ray Diffraction

Authors: F. Ichikawa, M. Okuno, Mitsuo Okamoto, F. Tanaka

195

X-Ray Diffraction Characterization of Thin Superconductive Films

Authors: Kris J. Kozaczek, G.W. Book, T.R. Watkins, W.B. Carter

203

X-Ray Backscatter Tomography: NDT Potential and Limitations

Authors: C.F. Poranski, E.C. Greenawald, Young Sam Ham

211

An X-Ray Sensitive CCD Camera System and Its Application to the X-Ray Diffractometric Investigation on Area Selective Semiconductor Epitaxy

Authors: F. Fandrich, R. Köhler

219

Determination of the Elastic Behaviour of Carbon-Reinforced Carbon Materials Using Laser-Ultrasound and Theoretical Modeling

Authors: M. Paul, B. Haberer, Andreas Hoffmann, M. Spies, W. Arnold

227

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Main Themes

Nondestructive Characterization of Materials VII