AES Depth Profiles of Nitrogen Ion Implanted Austenitic Stainless Steel |
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| Journal | Materials Science Forum (Volumes 223 - 224) |
|---|---|
| Volume | Disordered Materials |
| Edited by | D.K. Chaturvedi and G.E. Murch |
| Pages | 441-444 |
| DOI | 10.4028/www.scientific.net/MSF.223-224.441 |
| Citation | S. Aggarwal et al., 1996, Materials Science Forum, 223-224, 441 |
| Authors | S. Aggarwal, R.K. Mohindra, P.K. Ghosh, M.C. Bhatnagar |
| Keywords | Auger Electron Spectroscopy (AES), Austenitic Stainless Steel, Depth Profile |
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