European Powder Diffraction 4
Materials Science Forum Volumes 228 - 231
doi:10.4028/www.scientific.net/MSF.228-231
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p3
Structure Determination from Very Small Crystals
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334 K
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Authors: M.M. Harding
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p11
Analysis of Strain Fields by Means of Diffraction-Line Broadening
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373 K
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Authors: J.G.M. Van Berkum, Rob Delhez, T.H. de Keijser, Eric J. Mittemeijer
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p19
Application of the Smooth Genetic Algorithm for Indexing Powder Patterns – Tests for the Orthorhombic System
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294 K
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Authors: W. Paszkowicz
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p25
A Criterion for Correct Indexing of Powder Diffraction Diagrams Based on Preferred Orientation (Texture)
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133 K
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Authors: Hans Joachim Bunge, No Jin Park
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p29
Rietveld Refinement Using Debye-Scherrer Film Techniques
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265 K
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Authors: Luca Lutterotti, A.F. Gualtieri, S. Aldrighetti
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p35
Integration of Intensity and Angle Calibration into Rietveld Refinement
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243 K
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Authors: J. Schneider, A. Kern
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p39
Ab Initio Calculations of Diffraction Patterns of Submicron Powders
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215 K
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Authors: H. Marciniak, Stanislaw Gierlotka, Bogdan F. Palosz
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p43
Addition Method in the Quantitative Analysis: Dependence of Error on the Quantity of Additive
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278 K
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Authors: T. Balic Zunic
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p49
DOP-FIT Method for Quantitative Analysis of Multicomponent Powders
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151 K
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Authors: B. Gržeta, S. Popović, H. Toraya
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p55
Quantitative X-Ray Phase Analysis of Materials with Disordered Structures
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119 K
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Authors: R.P. Purlys, S.E. Stasiúnas, J.A. Yakimavichius
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p59
A New Possibility for Powder Diffraction: The Characterization of the Domain Microstructure in a Ferroelectric Material
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529 K
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Authors: C. Valot, N. Floquet, M.T. Mesnier, J.C. Niepce
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p67
X-Ray and Neutron Analysis of the Dislocation Content in Plastically Deformed β-Brass
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256 K
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Authors: D. Breuer, P. Klimanek
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p73
The Cross Correlation Method: A Useful Tool for Peak Shift Determination in XSE
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196 K
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Authors: V.R. Vosberg, W. Fischer, W.J. Quadakkers
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p77
Empirical Texture Correction for Different Diffraction Geometrics: Experimental Tests
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230 K
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Authors: R. Cerný, V. Valvoda
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p83
New Opportunities in the Texture and Stress Field by the Whole Pattern Analysis
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389 K
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Authors: Maurizio Ferrari, Luca Lutterotti, Siegfried Matthies, P. Polonioli, H.R. Wenk