Materials Science Forum

Paper Title	Page
Structure Determination from Very Small Crystals Authors: M.M. Harding	3
Analysis of Strain Fields by Means of Diffraction-Line Broadening Authors: J.G.M. Van Berkum, Rob Delhez, T.H. de Keijser, Eric J. Mittemeijer	11
Application of the Smooth Genetic Algorithm for Indexing Powder Patterns – Tests for the Orthorhombic System Authors: W. Paszkowicz	19
A Criterion for Correct Indexing of Powder Diffraction Diagrams Based on Preferred Orientation (Texture) Authors: Hans Joachim Bunge, No Jin Park	25
Rietveld Refinement Using Debye-Scherrer Film Techniques Authors: Luca Lutterotti, A.F. Gualtieri, S. Aldrighetti	29
Integration of Intensity and Angle Calibration into Rietveld Refinement Authors: J. Schneider, A. Kern	35
Ab Initio Calculations of Diffraction Patterns of Submicron Powders Authors: H. Marciniak, Stanislaw Gierlotka, Bogdan F. Palosz	39
Addition Method in the Quantitative Analysis: Dependence of Error on the Quantity of Additive Authors: T. Balic Zunic	43
DOP-FIT Method for Quantitative Analysis of Multicomponent Powders Authors: B. Gržeta, S. Popović, H. Toraya	49
Quantitative X-Ray Phase Analysis of Materials with Disordered Structures Authors: R.P. Purlys, S.E. Stasiúnas, J.A. Yakimavichius	55

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