Paper Title:
Application of the Rietveld Method to XRD Patterns of Thin Films Recorded in Parallel Beam Geometry
  Abstract

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Periodical
Materials Science Forum (Volumes 228-231)
Edited by
R.J. Cernik, R. Delhez and E.J. Mittemeijer
Pages
171-176
DOI
10.4028/www.scientific.net/MSF.228-231.171
Citation
W. Pitschke, "Application of the Rietveld Method to XRD Patterns of Thin Films Recorded in Parallel Beam Geometry", Materials Science Forum, Vols. 228-231, pp. 171-176, 1996
Online since
July 1996
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Price
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