Paper Title:
Application of a New Rietveld Software for Quantitative Phase Analysis and Lattice Parameter Determination of AIN-SiC-Ceramics
  Abstract

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Periodical
Materials Science Forum (Volumes 228-231)
Edited by
R.J. Cernik, R. Delhez and E.J. Mittemeijer
Pages
177-182
DOI
10.4028/www.scientific.net/MSF.228-231.177
Citation
T. Taut, J. Bergmann, G. Schreiber, A. Börner, E. Müller, "Application of a New Rietveld Software for Quantitative Phase Analysis and Lattice Parameter Determination of AIN-SiC-Ceramics", Materials Science Forum, Vols. 228-231, pp. 177-182, 1996
Online since
July 1996
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