Paper Title:
Structure Parameter Determination of Thin Films by Intensity Fitting in GIABD-Geometry
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 228-231)
Edited by
R.J. Cernik, R. Delhez and E.J. Mittemeijer
Pages
295-300
DOI
10.4028/www.scientific.net/MSF.228-231.295
Citation
J. Klimke, H. Wulff, "Structure Parameter Determination of Thin Films by Intensity Fitting in GIABD-Geometry", Materials Science Forum, Vols. 228-231, pp. 295-300, 1996
Online since
July 1996
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Price
$32.00
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