Paper Title:
Analysis of Residual Stress Gradients in Thin Films Using SEEMANN-BOHLIN-X-Ray Diffraction
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 228-231)
Edited by
R.J. Cernik, R. Delhez and E.J. Mittemeijer
Pages
301-306
DOI
10.4028/www.scientific.net/MSF.228-231.301
Citation
K. Fischer, H. Oettel, "Analysis of Residual Stress Gradients in Thin Films Using SEEMANN-BOHLIN-X-Ray Diffraction", Materials Science Forum, Vols. 228-231, pp. 301-306, 1996
Online since
July 1996
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Price
$32.00
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