Paper Title:
Temperature Resolved X-Ray Diffraction of Ammonium Nitrate Evaluated with Rietveld Analysis
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 228-231)
Edited by
R.J. Cernik, R. Delhez and E.J. Mittemeijer
Pages
359-362
DOI
10.4028/www.scientific.net/MSF.228-231.359
Citation
M. Herrmann, W. Engel, "Temperature Resolved X-Ray Diffraction of Ammonium Nitrate Evaluated with Rietveld Analysis", Materials Science Forum, Vols. 228-231, pp. 359-362, 1996
Online since
July 1996
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$32.00
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