On the Thickness-Dependence of Textures in Electrodeposited Copper-Coatings |
| Journal |
Materials Science Forum (Volumes 228 - 231) |
| Volume |
European Powder Diffraction 4 |
| Edited by |
R.J. Cernik, R. Delhez and E.J. Mittemeijer |
| Pages |
463-468 |
| DOI |
10.4028/www.scientific.net/MSF.228-231.463 |
| Citation |
I. Handreg et al., 1996, Materials Science Forum, 228-231, 463 |
| Authors |
I. Handreg, P. Klimanek, G. Lanza, M. Schneider |
| Keywords |
Atomic Force Microscope (AFM), Cu-Coatings, Electrodeposition, Epitaxy, Microstructure, Nucleation, Texture, X-Ray Diffraction (XRD) |
| Full Paper |
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