Paper Title:
X-Ray Diffraction Microstructural Characterization of PZT (Pb(ZrxTi1-x)O3 and Pt Thin Films on TiN/Ti/BPSG/Si Structures
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 228-231)
Edited by
R.J. Cernik, R. Delhez and E.J. Mittemeijer
Pages
487-492
DOI
10.4028/www.scientific.net/MSF.228-231.487
Citation
F. Varnière, B. Ea Kim, R. Bisaro, G. Chevrier, "X-Ray Diffraction Microstructural Characterization of PZT (Pb(ZrxTi1-x)O3 and Pt Thin Films on TiN/Ti/BPSG/Si Structures", Materials Science Forum, Vols. 228-231, pp. 487-492, 1996
Online since
July 1996
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.