Paper Title:
Shallow Angle X-Ray Diffraction from In-Situ Silica: Titania Sol-Gel Thin Films
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 228-231)
Edited by
R.J. Cernik, R. Delhez and E.J. Mittemeijer
Pages
525-530
DOI
10.4028/www.scientific.net/MSF.228-231.525
Citation
J.S. Rigden, R.J. Newport, M.E. Smith, P.J. Dirken, "Shallow Angle X-Ray Diffraction from In-Situ Silica: Titania Sol-Gel Thin Films", Materials Science Forum, Vols. 228-231, pp. 525-530, 1996
Online since
July 1996
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Price
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