Paper Title:
Grain Boundary Analysis in Superplastic SiO2 - Doped TZP
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 233-234)
Edited by
T. Sakuma, T. Aizawa and K. Higashi
Pages
367-374
DOI
10.4028/www.scientific.net/MSF.233-234.367
Citation
P. Thavorniti, Y. Ikuhara, T. Sakuma, "Grain Boundary Analysis in Superplastic SiO2 - Doped TZP", Materials Science Forum, Vols. 233-234, pp. 367-374, 1997
Online since
October 1996
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Price
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