Paper Title:
Buried SiO2 Films: Interfaces and Defects
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 239-241)
Edited by
G.E. Matthews and R.T. Williams
Pages
1-6
DOI
10.4028/www.scientific.net/MSF.239-241.1
Citation
A. Stesmans, "Buried SiO2 Films: Interfaces and Defects", Materials Science Forum, Vols. 239-241, pp. 1-6, 1997
Online since
January 1997
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Price
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