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Theory of Impurity Interactions in Silicon Dioxide

Journal Materials Science Forum (Volumes 239 - 241)
Volume Defects in Insulating Materials
Edited by G.E. Matthews and R.T. Williams
Pages 33-36
DOI 10.4028/www.scientific.net/MSF.239-241.33
Citation W. Beall Fowler et al., 1996, Materials Science Forum, 239-241, 33
Authors W. Beall Fowler, Arthur H. Edwards
Keywords Defect, Oxidation, Silicon, Silicon Dioxide, Theory
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