Materials Science Forum

Paper Title	Page
Ion Beam Induced Amorphization of Crystalline Solids: Mechanisms and Modeling Authors: H. Trinkaus	3
Surface Effect on the Nature of Damage Production in Ion-Irradiated Solids: A Molecular Dynamics Investigation Authors: M. Ghaly, Robert S. Averback	13
The Thermal Spike Model: A Possible Way to Describe the Effects Induced in Y₂O₃ by Swift Heavy Ion Irradiations Authors: C. Dufour, S. Hemon, F. Gourbilleau, E. Paumier, E. Dooryhee	21
Stopping Power and Range Relations for Low and High Z Ions in Solids: A Critical Analysis Authors: Hardev Singh Virk, G.S. Randhawa	33
Modeling of Ion Implantation and Diffusion in Si Authors: M.-J. Caturla, T. Diaz de la Rubia, P.J. Bedrossian	41
Crystal-Grid Investigation of Atomic Collision Cascades in Ionic Compounds Authors: M. Jentschel, K.H. Heinig, H.G. Börner, C. Doll	49
Thermal Spike Description of the Damage Creation in Y₃Al₅O₁₂ Induced by Swift Heavy Ions Authors: A. Meftah, M. Djebara, N. Khalfaoui, J.P. Stoquert, F. Studer, M. Toulemonde	53
Track Formation in Metals under Swift Heavy Ion Bombardment Authors: Yu.N. Yavlinskii	57
Diffusion in Ion Irradiated Nickel: Determination of Atomic Mixing, Sink Strength and Fraction of Freely Migrating Defects Authors: P. Fielitz, M.P. Macht, Volkmar Naundorf, H. Wollenberger	61
Ion-Beam Modification of Semiconductors and Related Electronic Materials Authors: R.G. Elliman	67

Paper Title

Page

Ion Beam Induced Amorphization of Crystalline Solids: Mechanisms and Modeling

Authors: H. Trinkaus

Surface Effect on the Nature of Damage Production in Ion-Irradiated Solids: A Molecular Dynamics Investigation

Authors: M. Ghaly, Robert S. Averback

The Thermal Spike Model: A Possible Way to Describe the Effects Induced in Y₂O₃ by Swift Heavy Ion Irradiations

Authors: C. Dufour, S. Hemon, F. Gourbilleau, E. Paumier, E. Dooryhee

Stopping Power and Range Relations for Low and High Z Ions in Solids: A Critical Analysis

Authors: Hardev Singh Virk, G.S. Randhawa

Modeling of Ion Implantation and Diffusion in Si

Authors: M.-J. Caturla, T. Diaz de la Rubia, P.J. Bedrossian

Crystal-Grid Investigation of Atomic Collision Cascades in Ionic Compounds

Authors: M. Jentschel, K.H. Heinig, H.G. Börner, C. Doll

Thermal Spike Description of the Damage Creation in Y₃Al₅O₁₂ Induced by Swift Heavy Ions

Authors: A. Meftah, M. Djebara, N. Khalfaoui, J.P. Stoquert, F. Studer, M. Toulemonde

Track Formation in Metals under Swift Heavy Ion Bombardment

Authors: Yu.N. Yavlinskii

Diffusion in Ion Irradiated Nickel: Determination of Atomic Mixing, Sink Strength and Fraction of Freely Migrating Defects

Authors: P. Fielitz, M.P. Macht, Volkmar Naundorf, H. Wollenberger

Ion-Beam Modification of Semiconductors and Related Electronic Materials

Authors: R.G. Elliman

Help

Information

Terms & Conditions

Terms & Conditions

Being allowed access to "Scientific.Net" ("the site") of Trans Tech Publications Ltd, you enter into the Scientific.Net user agreement on the terms and conditions set out below.

This Agreement is for an indefinite term. Either party can terminate for any reason at any time.

Copyright

Unless otherwise stated, copyright or similar rights in all material presented on the site, including PDFs and images, is owned by Trans Tech Publications Ltd.

Limited Permission to Copy

You are permitted to print or download extracts from these pages for your personal use only. Any copies of these pages saved to disk or to any other storage medium may only be used for subsequent viewing purposes or to print extract for personal use. You may not (whether directly or through the use of any software program) create a database in electronic or structured manual form by regularly or systematically downloading and storing all or any part of the pages from this site. No part of the site may be reproduced or transmitted to or stored in any other web site, nor may any of its pages or part thereof be disseminated in any electronic or non electronic form, nor included in any public or private electronic retrieval system without Trans Tech's prior written permission. Please contact us for requests to republish Trans Tech's material for distribution by using the contact-form on this site.

Individual Registration and Access

Each registration is for a single user only. To access the site you will be asked to enter your personal email address (the system will send an individual password to this email address). Therefore we do not permit any of the following:

Any other person sharing your User Name and Password
Any part of the site being cached in proxy servers and accessed by individuals who have not registered with Scientific.Net as users of the site.
Access through a single User Name and Password being made available to multiple users on a network. If we reasonably believe that a User Name and Password are being used in any of these ways, we reserve the right to cancel access rights immediately without notice, and block access to all users from that IP address.
In order to avoid misusage, downloads will be limited to 50 papers by day and 500 papers by month.

Main Themes

Materials Science Applications of Ion Beam Techniques