Paper Title:
In-Depth Characterization of Damage Produced by Swift Heavy Ion Irradiation Using a Tapping Mode Atomic Force Microscope
  Abstract

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Periodical
Materials Science Forum (Volumes 248-249)
Edited by
A.G. Balogh and G. Walter
Pages
129-134
DOI
10.4028/www.scientific.net/MSF.248-249.129
Citation
L.P. Biró, J. Gyulai , K. Havancsák, "In-Depth Characterization of Damage Produced by Swift Heavy Ion Irradiation Using a Tapping Mode Atomic Force Microscope", Materials Science Forum, Vols. 248-249, pp. 129-134, 1997
Online since
May 1997
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