Paper Title:
Investigation of the Morphology of Porous Silicon by Rutherford Backscattering Spectrometry
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 248-249)
Edited by
A.G. Balogh and G. Walter
Pages
373-376
DOI
10.4028/www.scientific.net/MSF.248-249.373
Citation
E. Szilágyi, Z. Hajnal, F. Pászti, O. Buiu, G. Craciun, C. Cobianu, C. Savaniu, É. Vázsonyi, "Investigation of the Morphology of Porous Silicon by Rutherford Backscattering Spectrometry", Materials Science Forum, Vols. 248-249, pp. 373-376, 1997
Online since
May 1997
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Price
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