Paper Title:
Combining RBS and FTIR Spectroscopy for the Ge Analysis in Si1-xGex Single Crystals
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 248-249)
Edited by
A.G. Balogh and G. Walter
Pages
377-380
DOI
10.4028/www.scientific.net/MSF.248-249.377
Citation
A. Gerhardt, J. Donecker, B. Selle, J. Wollweber, "Combining RBS and FTIR Spectroscopy for the Ge Analysis in Si1-xGex Single Crystals", Materials Science Forum, Vols. 248-249, pp. 377-380, 1997
Online since
May 1997
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Price
$32.00
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