Paper Title:
Thin-Film Morphology and Rutherford Backscattering Spectrometry
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 248-249)
Edited by
A.G. Balogh and G. Walter
Pages
409-412
DOI
10.4028/www.scientific.net/MSF.248-249.409
Citation
T. Hahn, H. Metzner, M. Gossla, J. Conrad, "Thin-Film Morphology and Rutherford Backscattering Spectrometry", Materials Science Forum, Vols. 248-249, pp. 409-412, 1997
Online since
May 1997
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Price
$32.00
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