Paper Title:
Electronic Sputtering and Desorption Effects in TOF-SIMS Studies Using Slow Highly Charged Ions like Au69+
  Abstract

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Periodical
Materials Science Forum (Volumes 248-249)
Edited by
A.G. Balogh and G. Walter
Pages
413-418
DOI
10.4028/www.scientific.net/MSF.248-249.413
Citation
T. Schenkel, M.A. Briere, H. Schmidt-Böcking, K. Bethge, D. Schneider, "Electronic Sputtering and Desorption Effects in TOF-SIMS Studies Using Slow Highly Charged Ions like Au69+", Materials Science Forum, Vols. 248-249, pp. 413-418, 1997
Online since
May 1997
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Price
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