Status of a New Analytical Facility Based on the 2 MeV Electrostatic Accelerator in the Institute of Applied Physics |
| Journal |
Materials Science Forum (Volumes 248 - 249) |
| Volume |
Materials Science Applications of Ion Beam Techniques |
| Edited by |
A.G. Balogh and G. Walter |
| Pages |
477-0 |
| DOI |
10.4028/www.scientific.net/MSF.248-249.477 |
| Citation |
I. Karnaukhov et al., 1997, Materials Science Forum, 248-249, 477 |
| Authors |
I. Karnaukhov, O. Ehichev, P. Gladkikh, S. Lebed, V. Miroshnichenko, A. Mytsykov, A. Shcherbakov, V. Storizhko |
| Keywords |
Computer Simulation, Electrostatic Accelerator, Microprobe, Scanning Ion Microprobe, Submicrometer Spatial Resolution |
| Full Paper |
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