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Materials Science Applications of Ion Beam Techniques

Materials Science Forum Volumes 248 - 249

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• p409 Thin-Film Morphology and Rutherford Backscattering Spectrometry   [ 223 K ]
  Authors: Th. Hahn, H. Metzner, M. Gossla, J. Conrad
• p413 Electronic Sputtering and Desorption Effects in TOF-SIMS Studies Using Slow Highly Charged Ions like Au⁶⁹⁺   [ 246 K ]
  Authors: T. Schenkel, M.A. Briere, H. Schmidt-Böcking, Klaus Bethge, D. Schneider
• p419 Ion Channeling Study of GaN Single Crystals   [ 225 K ]
  Authors: Andrzej Turos, Lubomir J. Nowicki, A. Stonert, M. Leszczyński, I. Grzegory, Sylwester Porowski
• p427 Highly Focused Ion Beams in Integrated Circuit Testing   [ 499 K ]
  Authors: K.M. Horn, P.E. Dodd, B.L. Doyle
• p433 Atomic Structure and Electrical Properties of a Supertip Gas Field-Ion Source   [ 301 K ]
  Authors: Th. Miller, A. Knoblauch, S. Kalbitzer
• p439 High Energy Ion Microprobes: Where are we going?   [ 211 K ]
  Authors: T. Butz, R.-H. Flagmeyer
• p445 Application of Highly Focused Ion Beams   [ 335 K ]
  Authors: L. Bischoff, J. Teichert
• p451 Use of an Ultra-High Resolution Magnetic Spectrograph for Materials Research   [ 452 K ]
  Authors: D.O. Boerma, W.M. Arnoldbik, W. Wolfswinkel
• p459 Ion Beam Analysis with Monolayer Depth Resolution   [ 474 K ]
  Authors: H.D. Carstanjen
• p467 Applications of Ion Track Filters   [ 181 K ]
  Authors: S. Amrita Kaur, Hardev Singh Virk, S.K. Chakarvarti
• p471 Theoretical and Experimental Study of the Stationary and Kinetic Characteristics of the Thermo-Field Ion Sources   [ 235 K ]
  Authors: N.V. Egorov, B.V. Yakovlev
• p477 Status of a New Analytical Facility Based on the 2 MeV Electrostatic Accelerator in the Institute of Applied Physics   [ 181 K ]
  Authors: I. Karnaukhov, O. Ehichev, P. Gladkikh, S. Lebed, V. Miroshnichenko, A. Mytsykov, A. Shcherbakov, V. Storizhko