The Stress State in Thermally Grown NiO Scales |
| Journal |
Materials Science Forum (Volumes 251 - 254) |
| Volume |
High Temperature Corrosion and Protection of Materials 4 |
| Edited by |
Roland Streiff, John Stringer, Richard C. Krutenat, Marcel Caillet and Robert A. Rapp |
| Pages |
325-332 |
| DOI |
10.4028/www.scientific.net/MSF.251-254.325 |
| Citation |
Peggy Y. Hou et al., 1997, Materials Science Forum, 251-254, 325 |
| Authors |
Peggy Y. Hou, R.M. Cannon |
| Keywords |
Diffusion, Growth Stresses, Nickel Oxide, Oxidation, Residual Stress, X-Ray Diffraction (XRD) |
| Full Paper |
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