Paper Title:
Determination of Stress Gradients in a Thermally Grown Oxide Layer Using X-Ray Diffraction
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 251-254)
Edited by
Roland Streiff, John Stringer, Richard C. Krutenat, Marcel Caillet and Robert A. Rapp
Pages
333-340
DOI
10.4028/www.scientific.net/MSF.251-254.333
Citation
D. Zhu, J.H. Stout, D.A. Shores, "Determination of Stress Gradients in a Thermally Grown Oxide Layer Using X-Ray Diffraction", Materials Science Forum, Vols. 251-254, pp. 333-340, 1997
Online since
October 1997
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Price
$32.00
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