Determination of Stress Gradients in a Thermally Grown Oxide Layer Using X-Ray Diffraction

Zhu, Di; Stout, J.H.; Shores, D.A.

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Periodical	Materials Science Forum (Volumes 251 - 254)
Main Theme	High Temperature Corrosion and Protection of Materials 4
Edited by	Roland Streiff, John Stringer, Richard C. Krutenat, Marcel Caillet and Robert A. Rapp
Pages	333-340
DOI	10.4028/www.scientific.net/MSF.251-254.333
Citation	Di Zhu et al., 1997, Materials Science Forum, 251-254, 333
Authors	Di Zhu, J.H. Stout, D.A. Shores
Keywords	High Temperature Oxidation, In Situ Oxide Growth Strain, Reactive Element Effects, Residual Strains, Stress Gradients, X-Ray Diffraction (XRD)
Price	US$ 28,-

Paper Titles

Determination of Stress Gradients in a Thermally Grown Oxide Layer Using X-Ray Diffraction