Paper Title:
Combination of Positron Annihilation and Scanning Tunneling Microscopy: A Unique Approach to Characterize Defects
  Abstract

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Periodical
Materials Science Forum (Volumes 255-257)
Edited by
Y. C. Jean, Morten Eldrup, David M. Schrader, Roy N. West
Pages
494-496
DOI
10.4028/www.scientific.net/MSF.255-257.494
Citation
J. Gebauer, R. Krause-Rehberg, C. Domke, P. Ebert, K. Urban, "Combination of Positron Annihilation and Scanning Tunneling Microscopy: A Unique Approach to Characterize Defects", Materials Science Forum, Vols. 255-257, pp. 494-496, 1997
Online since
September 1997
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